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43.3: Integration of Reliability with High Current Drivability by using SELAX Technology for High‐Resolution (>300 ppi) System‐in‐Displays
Author(s) -
Toyota Y.,
Matsumura M.,
Hatano M.,
Shiba T.,
Itoga T.,
Ohkura M.
Publication year - 2005
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2036278
Subject(s) - thin film transistor , reliability (semiconductor) , materials science , high voltage , high resolution , electronic circuit , voltage , power (physics) , electrical engineering , low voltage , optoelectronics , electronic engineering , computer science , engineering , nanotechnology , layer (electronics) , physics , remote sensing , quantum mechanics , geology
High‐resolution (>300 ppi) system‐in‐displays have been developed by using mixed low‐voltage/high‐voltage poly‐silicon TFTs. That is, ELC TFTs are used for the display circuits with high‐voltage endurance, and SELAX TFTs are used for the low‐power, high‐performance display circuits. In this hybrid TFT, the SELAX TFTs successfully integrate reliability with high current drivability.