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36.2: The Lifetime and Pinholes in the External Electrode Fluorescent Lamps
Author(s) -
Gill DohHyun,
Song Hyucksoo,
Kim JungHyun,
Kim SangJin,
Kim Sangbeom,
Kim TaekYoung,
Yu DongGeun,
Koo JeHuan,
Choi EunHa,
Cho Guangsup
Publication year - 2005
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2036246
Subject(s) - pinhole (optics) , torr , materials science , electrode , optoelectronics , capacitive sensing , dielectric barrier discharge , fluorescence , layer (electronics) , dielectric , range (aeronautics) , optics , electrical engineering , composite material , chemistry , physics , engineering , thermodynamics
At the pressure range of 30∼200 Torr in EEFLs, the lifetimes will be discussed to be about 60,000 hours in the long run operation of 11,000 hours. In the test of lamp failure, pinhole formation has been shown to be the insulation layer breakdown of glass in the dielectric barrier discharge of capacitive coupled EEFLs.