Premium
24.3: Distinguished Contributed Paper: Line Drive Technology: An Advanced TERES with the Integration of High‐Voltage Sustain and Scan Circuits into Ics
Author(s) -
Tomio Shigetoshi,
Furukawa Isao,
Ito Katsumi,
Kishi Tomokatsu
Publication year - 2005
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.2036193
Subject(s) - voltage , line (geometry) , high voltage , electrical engineering , electronic circuit , engineering , computer science , mathematics , geometry
In our previous paper, we proposed TERES technology, which halves sustain voltage and power loss without reducing applied voltages to PDP cells. In this paper, we report Line Drive technology, an advanced TERES, which integrates the high voltage sustain and scan circuit into ICs.