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Measurement of tilt‐bias angle: performance evaluation of the crystal rotation method
Author(s) -
Becker M. E.
Publication year - 1997
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.1985163
Subject(s) - tilt (camera) , repeatability , realization (probability) , rotation (mathematics) , computer science , optics , reproducibility , automation , materials science , physics , computer vision , mechanical engineering , mathematics , statistics , geometry , engineering
— An industrial‐use realization for measuring tilt‐bias angles (pre‐tilt angles) of non‐twisted LC layers is introduced and its performance is analyzed with respect to accuracy, repeatability, and reproducibility. The apparatus is based on the improved version of the crystal‐rotation method which avoids all of the systematic limitations of the original approach. Various possible sources of error are discussed and their effects on the results of evaluation is analyzed experimentally and with numerical simulation. Due to the high degree of device automation, the results of evaluation are not dependent on the individual skills of the operator. It is shown that the presented specific realization for evaluation of tilt‐bias angles for the first time offers unprecedented performance at low cost.