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An on‐line grid‐gaps inspection system for electron‐gun manufacturing
Author(s) -
Mo ChiNeng,
Sheng Yi,
Yeh ChunHsien,
Chang Ming,
Lin KaoHui
Publication year - 2001
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.1844660
Subject(s) - computer science , line (geometry) , electron gun , grid , computer vision , stepper motor , automated x ray inspection , artificial intelligence , image processing , computer hardware , image (mathematics) , electron , engineering , physics , mechanical engineering , geometry , mathematics , quantum mechanics , cathode ray
— An on‐line grid gaps inspection system (GGIS) for color‐CRT electron‐gun manufacturing has been developed. The measuring principle is based on the digital‐image‐processing technique and incorporates a design of stepping motor motion control. By utilizing the arrangement of stepping path image processing, the measurements for different types of guns and for different gaps on a gun can be effectively executed with higher resolution, and are easily implemented for the purposes of on‐line inspection and statistical quality control. Experimental results show that the system resolution is about 8.5–10 μm and the on‐line inspection index has been improved to about 120 pieces/hour.