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Comprehensive Intraplant and Interplant Correlation of Photometric Measurements for Avionics LCDs
Author(s) -
Torrington Geoffrey K.,
Cull Brian D.,
Haim Victoria,
Wiggs John
Publication year - 1999
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1834140
Subject(s) - nist , avionics , traceability , colorimeter , crts , computer science , remote sensing , engineering , computer graphics (images) , aerospace engineering , optics , physics , speech recognition , geology , software engineering
Honeywell has developed and implemented a comprehensive intraplant and interplant colorimeter certification method with traceability to NIST standards for inspection of avionics LCDs. To perform effective interplant correlation of optical measurements, special‐purpose hardware was specified, designed, and built. Since the implementation of these procedures, increases in interplant correlation have helped to dramatically reduce the cycle time for LCD glass; and intraplant correlation has improved to the level where grouping in CIELuv space by colorimeters is no longer apparent.