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P‐25: Secondary ‐Electron‐Emission Analysis of MgO Films in ac Plasma Displays
Author(s) -
Ishimoto M.,
Hidaka S.,
Betsui K.,
Shinoda T.
Publication year - 1999
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1834081
Subject(s) - plasma display , plasma , materials science , electron , analytical chemistry (journal) , optoelectronics , atomic physics , chemistry , physics , environmental chemistry , electrode , nuclear physics
The ion‐induced secondary‐electron‐emission yield of MgO films by the ion gun method was successfully measured. Variations due to crystal orientation and ion kinetic energy were observed. Ejected electron energy showed correlation with the ionization energy of the gas.