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P‐4: Defect Detection in Reflective Liquid‐Crystal Microdisplays
Author(s) -
Pratt W. K.,
Pendergrass R. A.,
Sawkar S. S.
Publication year - 1999
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1834058
Subject(s) - luminance , pixel , brightness , liquid crystal display , row , artificial intelligence , computer vision , computer science , contrast (vision) , liquid crystal on silicon , materials science , computer graphics (images) , optics , optoelectronics , physics , database
This paper describes a recently developed automatic inspection system which detects, measures and classifies defects in reflective liquid crystal on silicon micro displays. The detected defects include single pixels and rows and columns of pixels of incorrect luminance. In addition, the system is capable of detecting and classifying a variety of blemishes, called mura, that appear as low‐contrast, non‐uniform brightness regions.