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35.3: A High‐Aperture and High‐Reliability Full‐Color TFT‐LCD
Author(s) -
Zhong J. Z. Z.,
Boer W.,
Byun Y. H.,
Gu T.,
Brinkley R.,
Thomsen S. V.
Publication year - 1998
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833927
Subject(s) - thin film transistor , liquid crystal display , materials science , compensation (psychology) , aperture (computer memory) , active matrix , optoelectronics , pixel , reliability (semiconductor) , full color , optics , electrode , engineering , physics , mechanical engineering , psychology , power (physics) , layer (electronics) , quantum mechanics , psychoanalysis , composite material
A high‐aperture 6.25×6.25 in. full‐color a ‐Si TFT LCD with 1024×1024 dots and 164 lpi resolution has been fabricated. The high aperture ratio is achieved by overlapping the ITO pixel electrode and bus line using a photo‐sensitive polymer. This AMLCD has been incorporated with an ultra‐low reflectance black matrix and an optical compensation film for high‐quality performance.

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