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P‐31: Characterization of Emitting Carbon Films and Their Deposition on Glass Substrates
Author(s) -
Fink R. L.,
Tolt Z. Li,
Yaniv Z.
Publication year - 1998
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833822
Subject(s) - characterization (materials science) , raman spectroscopy , materials science , carbon fibers , deposition (geology) , excitation , atomic force microscopy , field electron emission , analytical chemistry (journal) , spectroscopy , carbon film , thin film , nanotechnology , chemistry , optics , composite material , physics , environmental chemistry , paleontology , quantum mechanics , sediment , composite number , biology , electron
Carbon films having low threshold extraction field, high emission site density and high emission current density were characterized by Uv‐ excitation Raman spectroscopy and atomic force microscopy (AFM). An hypothesis of the nature of emission sites in these films is proposed in accordance with the analyses.