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Analysis of He‐Xe Discharge Kinetics in an AC PDP Cell
Author(s) -
Jeong Heui Seob,
Seo Jeong Hyun,
Yoon Cha Keun,
Kim Joong Kyun,
Whang KiWoong
Publication year - 1998
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833768
Subject(s) - atomic physics , ion , excitation , xenon , resonance (particle physics) , chemistry , time constant , kinetic energy , electron , radiation , kinetics , analytical chemistry (journal) , physics , optics , organic chemistry , quantum mechanics , electrical engineering , engineering , chromatography
We measured the time variation of 147nm VUV Xe*( 3 P 1 ) resonance emission as well as the continuum from the He‐Xe discharge in a single surface discharge type AC PDP cell using an image intensified CCD camera. A detailed measurement of the resonance radiation exhibits a strong pressure broadening, fast rising to its peak and decay with multiple time constant. The decay time constants, relative intensities of resonance and dimer radiation change with the total gas pressure as well as the Xe content which implies that the collisional excitation, deexcitation and interlevel transition play important role in determining the VUV emission characteristics. We solved the He‐Xe discharge reaction equations together with the 2‐dimensional multi‐fluid equations for electron and ions to explain the experimental results and elucidate the dominant kinetic pathways which lead to the VUV emission in the AC PDP cells.