40.3: Ultra‐High Brightness 1.8‐in. XGA poly‐Si TFT LCD | Zendy

Uchino Katsuhide | Zendy; Kashima Tomohiro | Zendy; Abe Fumiaki | Zendy; Hirano Masumi | Zendy; Satoh Masahiko | Zendy; Maekawa Toshikazu | Zendy

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40.3: Ultra‐High Brightness 1.8‐in. XGA poly‐Si TFT LCD

Author(s) -

Uchino Katsuhide,

Kashima Tomohiro,

Abe Fumiaki,

Hirano Masumi,

Satoh Masahiko,

Maekawa Toshikazu

Publication year - 1998

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.1833670

Subject(s) - liquid crystal display , thin film transistor , brightness , materials science , pixel , luminance , active matrix , diagonal , optoelectronics , high resolution , chip , oled , optics , electrical engineering , physics , engineering , nanotechnology , mathematics , geometry , layer (electronics) , remote sensing , geology

A 1.8‐in. diagonal poly‐Si TFT LCD applicable to a full XGA format, well suited for displaying high luminance of 1800 ANSI lm, has been developed. We have optimized the pixel structure with an “advanced” on‐chip‐black matrix and developed a “Pre‐charging method” to achieve high luminosity. We also have developed “ghost‐free” circuitry to suppress a “ghost” effect, which frequently occurs in high resolution LCDs operated with high frequencies.

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