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40.3: Ultra‐High Brightness 1.8‐in. XGA poly‐Si TFT LCD
Author(s) -
Uchino Katsuhide,
Kashima Tomohiro,
Abe Fumiaki,
Hirano Masumi,
Satoh Masahiko,
Maekawa Toshikazu
Publication year - 1998
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833670
Subject(s) - liquid crystal display , thin film transistor , brightness , materials science , pixel , luminance , active matrix , diagonal , optoelectronics , high resolution , chip , oled , optics , electrical engineering , physics , engineering , nanotechnology , mathematics , geometry , layer (electronics) , remote sensing , geology
A 1.8‐in. diagonal poly‐Si TFT LCD applicable to a full XGA format, well suited for displaying high luminance of 1800 ANSI lm, has been developed. We have optimized the pixel structure with an “advanced” on‐chip‐black matrix and developed a “Pre‐charging method” to achieve high luminosity. We also have developed “ghost‐free” circuitry to suppress a “ghost” effect, which frequently occurs in high resolution LCDs operated with high frequencies.