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9.3: High‐Resolution 5‐in. Full‐Color FEDs with New Aging Technique
Author(s) -
Kim J. M.,
Park N. S.,
Choi J. H.,
Lee H. W.,
Kim J. W.,
Hong S. S.,
Choe S.
Publication year - 1998
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833663
Subject(s) - field emission display , materials science , diagonal , high resolution , optoelectronics , full color , field electron emission , electron , physics , geometry , mathematics , remote sensing , quantum mechanics , geology
High resolution field emission display (FED) devices of 5 inch developed. Under scheme, electron diagonal in size are the gate‐switching trajectory profiles fully drive are simulated and tested. Uniquely‐printed spacer with high aspect ratio are fabricated on ITO coated glass for high vacuum packaging. In addition, new gas aging scheme of stabilizing field emitting array are extensively investigated during the sealing and exhausting process in order to prevent oxidation effects on the micro tip. Finally, full color images of 64 gray scale will be demonstrated.