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8.1: Proposed Methods for PDP Characterization by PDP Consortium in Japan
Author(s) -
Kurita Taiichiro,
Murakami Hiroshi
Publication year - 2000
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833048
Subject(s) - plasma display , computer science , chemistry , electrode
Abstract The Hi‐Vision PDP Consortium, which consisted of more than 26 PDP‐related manufacturers in Japan and NHK, successfully completed its activities in October 1999 with the publication of measurement methods for PDP displays. This paper reports on the methods.