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P‐26: Improvement in Measuring the Luminance Distribution of the CRT Electron Beam Spot
Author(s) -
Shiramatsu Naoki,
Iwata Shuji
Publication year - 2000
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1833024
Subject(s) - luminance , optics , reliability (semiconductor) , sensitivity (control systems) , cathode ray , range (aeronautics) , electron , beam (structure) , dynamic range , materials science , computer science , physics , engineering , electronic engineering , power (physics) , nuclear physics , quantum mechanics , composite material
Abstract Improvement of the sensitivity and the dynamic range of the imaging method achieved the measurement that is comparable to the human vision. Also suggested reconstruction algorithm improved the reliability of the measurement. Newly investigated measurement method is available for evaluating the electron beam distribution.