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25.2: Invited Paper : Implications of Super High Resolution to Array Testing
Author(s) -
Freeman David,
Hawthorne Jeff
Publication year - 2000
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1832960
Subject(s) - pixel , test (biology) , feature (linguistics) , computer science , high resolution , resolution (logic) , artificial intelligence , computer vision , remote sensing , geography , geology , paleontology , linguistics , philosophy
In the later half of 2000, display manufacturers will begin mass producing displays with resolutions from 150 to 200 pixels/in. These displays will have a color sub‐pixel pitch of from 42 to 56 mm. For array inspection and test equipment, reduced pixel feature sizes and increased pixel counts will present new challenges in the areas of resolution, test time, and test coverage. The implications of these challenges for functional electrical testing will be discussed, and tradeoffs between test coverage and test time will be presented.