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35.3L: Late‐News Paper : Optical and Electrical Characterization of Particle‐Related Defects in Large Area Inorganic Thick Dielectric Electroluminescent Displays
Author(s) -
Luke D.,
Yang R.,
Briglio D.,
Abe H.,
Yoshida I.,
Hamada H.
Publication year - 2003
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1832483
Subject(s) - electroluminescence , materials science , dielectric , characterization (materials science) , fabrication , optoelectronics , liquid crystal display , particle (ecology) , yield (engineering) , nanotechnology , composite material , medicine , oceanography , alternative medicine , layer (electronics) , pathology , geology
Thick dielectric electroluminescent displays are tolerant of particle‐related defects introduced during fabrication processes compared to TFT‐LCD displays. Early experimental trials have shown that displays can have a high incidence of particle‐related defects and that a small percentage of the defects had an adverse effect on display performance or image quality. Defects introduced at different steps in the fabrication process have been characterized and their impact on the projected manufacturing yield for the displays assessed. Characterization was carried out using electrical and optical measurement techniques.