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P‐101: Eliminating Layer Undulation Textures in SSFLC Devices
Author(s) -
Wang Chenhui,
Bos Philip J.,
Kumar Satyendra,
Wand Michael,
Handschy Mark
Publication year - 2003
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1832349
Subject(s) - layer (electronics) , texture (cosmology) , phase (matter) , sma* , materials science , optics , diffraction , composite material , chemistry , physics , computer science , image (mathematics) , algorithm , artificial intelligence , organic chemistry
Temperature dependence of the smectic layer structures was studied by high resolution X‐ray diffraction analysis. The investigation was based on two different alignment SSFLC cells. The effect of layer spacing changes in the SmA phase on defects seen in the SmC phase of the devices is investigated. It is shown that when considering a defect free SmC* texture, the layer spacing changes in the SmA phase are more significant than changes in the SmC phase. An explanation is also proposed.