Premium
P‐73: ITO Characteristics on Different Under‐Layer for AM‐OLED Displays
Author(s) -
Hsieh HsiuChun,
Chang ShihChang,
Tsai YawMing
Publication year - 2003
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1832321
Subject(s) - oled , materials science , transmittance , surface roughness , optoelectronics , layer (electronics) , luminance , surface finish , optics , composite material , physics
The characteristics of ITO film on different under‐layers including Si‐containing insulators and organic materials were investigated. It was found that the visible light transmittance of ITO film on different under‐layer is maintained, however, the surface morphology of ITO film depends strongly on different underlayers. The surface roughness of ITO film on the organic materials is 3 times larger than that on insulating materials. Also observed is the strong dependent of surface roughness on luminance efficiency. Base on these results, a new pixel structure is proposed for AM‐OLED applications. With this new pixel structure, the good properties of ITO film can be obtained and used for high efficiency and long lifetime AM‐OLED displays.