P‐1: Analysis of IPS Mura, Image‐Sticking and Flicker Caused by Internal DC Effects | Zendy

Park H. J. | Zendy; Lai Luc. | Zendy; Lin S. H. | Zendy; Yang K. H. | Zendy

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P‐1: Analysis of IPS Mura, Image‐Sticking and Flicker Caused by Internal DC Effects

Author(s) -

Park H. J.,

Lai Luc.,

Lin S. H.,

Yang K. H.

Publication year - 2003

Publication title -

sid symposium digest of technical papers

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.351

H-Index - 44

eISSN - 2168-0159

pISSN - 0097-966X

DOI - 10.1889/1.1832238

Subject(s) - mura , process (computing) , voltage , flicker , image (mathematics) , computer science , materials science , computer vision , electrical engineering , optoelectronics , engineering , computer graphics (images) , liquid crystal display , operating system

The IPS Mura related to array process is analyzed from its optical properties by examining enhanced macro and micro digital images using a novel DC ion‐charging method. Image sticking and time‐dependent flicker have been investigated by a bipolar DC voltage‐stress method on three different IPS test‐cell structures using a TN cell as a reference. The experimental results on image sticking and flicker are analyzed from a viewpoint of internal DC voltage.

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