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P‐1: Analysis of IPS Mura, Image‐Sticking and Flicker Caused by Internal DC Effects
Author(s) -
Park H. J.,
Lai Luc.,
Lin S. H.,
Yang K. H.
Publication year - 2003
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1832238
Subject(s) - mura , process (computing) , voltage , flicker , image (mathematics) , computer science , materials science , computer vision , electrical engineering , optoelectronics , engineering , computer graphics (images) , liquid crystal display , operating system
The IPS Mura related to array process is analyzed from its optical properties by examining enhanced macro and micro digital images using a novel DC ion‐charging method. Image sticking and time‐dependent flicker have been investigated by a bipolar DC voltage‐stress method on three different IPS test‐cell structures using a TN cell as a reference. The experimental results on image sticking and flicker are analyzed from a viewpoint of internal DC voltage.