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8.1: New Insights Into the Degradation of Field Emission Displays
Author(s) -
Reuss Robert H.,
Chalamala Babu R.
Publication year - 2001
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1831992
Subject(s) - common emitter , degradation (telecommunications) , field electron emission , materials science , field (mathematics) , engineering physics , residual , optoelectronics , electrode , electrical engineering , computer science , engineering , chemistry , physics , electron , mathematics , algorithm , quantum mechanics , pure mathematics
Field emission displays can be seriously limited by the rapid current degradation of Mo field emitter arrays primarily due to poor vacuum conditions inside their thin vacuum packages. There have been a number of studies to understand the degradation mechanisms. However, we find that degradation models that have been proposed so far are not consistent with observed device behavior in a variety of gas ambients. In this paper, we present a summary of our results on residual gases inside field emission displays and the effects of these gases on emission behavior. We describe how these issues and the inter‐electrode spacing leading to local pressure buildup impact device life. We present an alternate model based on shallow ion implant to explain the device behavior.