Premium
LP‐3: Late‐News Poster : Optical Simulations and Measurements of In‐Plane Switching Structures with Rapid Refractive‐Index Variations
Author(s) -
Boer D. K. G.,
Cortie R.,
Pearson A. D.,
Becker M. E.,
Wöhler H.,
Olivero D.,
Peverini O. A.,
Neyts K.,
Kriezis E. E.,
Elston S. J.
Publication year - 2001
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1831991
Subject(s) - refractive index , diffraction , plane (geometry) , optics , grating , beam (structure) , order (exchange) , diffraction grating , index (typography) , physics , materials science , mathematics , computer science , geometry , finance , world wide web , economics
Abstract Measurements and simulations of liquid‐crystal devices with In‐Plane Switching structures are compared. It is shown that the Jones calculus breaks down in case of rapid lateral variations in the director profile. Advanced simulation methods like the reduced‐order grating method and the beam propagation method, which take into account diffraction effects, show good agreement with experiment.