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P‐33: A Novel TFT‐LCD Characterization Method Using Retention Measurement
Author(s) -
Tokuhiro Osamu,
Furumoto Katsuyiki,
Sorida Mikinari,
Miyazaki Yoshihiro
Publication year - 2001
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1831951
Subject(s) - thin film transistor , transmittance , data retention , flicker , liquid crystal display , retention time , materials science , optoelectronics , voltage , computer science , electronic engineering , electrical engineering , engineering , nanotechnology , chemistry , layer (electronics) , chromatography
We have developed an optical measurement system for TFT‐LCD cells which measures not only conventional optical characteristics such as voltage‐transmittance, flicker and response time but also retention time. By using specific TFT driving condition, retention time measurement can address the cause of various current leakage problems.