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P‐30: Determination of Impurities in Organic Light Emitting Diode Displays using a Dedicated Mass Spectrometric Technique
Author(s) -
Tominetti S.,
Renzo A.
Publication year - 2001
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1831948
Subject(s) - oled , impurity , moisture , materials science , optoelectronics , encapsulation (networking) , diode , process engineering , analytical chemistry (journal) , chemistry , nanotechnology , chromatography , computer science , engineering , organic chemistry , composite material , computer network , layer (electronics)
The exploitation of OLED displays is strongly dependent on an efficient system of encapsulation and moisture removal from the device. The effectiveness of the device design and materials selection can be properly addressed by the quantitative analysis of moisture and impurities levels by means of a dedicated mass spectrometric technique.