Premium
P‐19: Morphological Analysis of Disposed Screen and Disposing Processes Optimization by Robust Design
Author(s) -
Lee SeungHoun,
Nam GeonYong,
Kim JinPal
Publication year - 2001
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1831936
Subject(s) - phosphor , morphology (biology) , materials science , process (computing) , mathematical morphology , image quality , measure (data warehouse) , optics , computer science , image (mathematics) , image processing , computer vision , optoelectronics , physics , database , geology , paleontology , operating system
Abstract In the CRT image quality, the geometrical morphology of phosphor such as the phosphor thickness and density is important to maintain uniform color. In this work, the morphology of screen is analyzed by Morphological Analysis to establish the relationship between the Morphology of Phosphor and Image quality. To do this the Morphology of screen is measured by non‐contact profiler. The non‐contact profiler permits to measure precisely geometrical characteristics of phosphor on the screen. From the different process condition the screen surface is measured and analyzed to search optimal process condition.