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P‐121: Optical Characterization of Metal Reflectors
Author(s) -
Shen Li,
Koehler Curt,
Strobl Karlheinz
Publication year - 2004
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1831081
Subject(s) - characterization (materials science) , scaling , process (computing) , quality (philosophy) , volume (thermodynamics) , series (stratigraphy) , production line , computer science , metal , process engineering , materials science , engineering , nanotechnology , mechanical engineering , metallurgy , mathematics , physics , geology , paleontology , geometry , quantum mechanics , operating system
We present a series of quality control tools that have been developed to optimize a production line for eele‐enhanced® metal reflectors for performance and cost and to enable the determination of the optimum process parameters needed for the cost effective volume scaling of the various manufacturing processes involved.