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15.1: A Method to Measure the Optical Uniformity of LCOS Displays
Author(s) -
Bone Matthew,
Davidson Iain
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830872
Subject(s) - measure (data warehouse) , liquid crystal on silicon , sample (material) , line (geometry) , process (computing) , data acquisition , optics , computer science , materials science , optoelectronics , liquid crystal display , physics , mathematics , geometry , database , thermodynamics , operating system
A novel method to measure the optical uniformity of LCOS displays has been developed. The technique measures spatial variation in the electro‐optic curve over the active area of a display using a CCD and automated data acquisition system. Spatial non‐uniformities in cell gap of 1/10 th a fringe are measured and characterized quickly (<15s). The experimental method will be described and the results of measurements and data analysis on sample LCOS imagers will be presented. The method is well suited to monitoring process capability and has been implemented as an in line test.