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P‐97: Phase Compensator Method for Cell Thickness and Twist Angle Measurements in a Reflective Twisted Nematic LC Cell
Author(s) -
Gwag Jin Seog,
Han KwanYoung,
Yoon TaeHoon,
Kim Jae Chang
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830866
Subject(s) - liquid crystal , twist , optics , materials science , wavelength , phase (matter) , phase compensation , laser , narrow gap , optoelectronics , physics , geometry , mathematics , quantum mechanics , phase noise , mechanics
We propose a simple and accurate measurement method to determine cell gap and twist angle of a reflective twisted‐nematic liquid crystal (TNLC) cell by using a phase compensator. A single wavelength source (red or green laser) is used for cell gap measurement and two wavelength sources (red and green lasers) for a twist angle measurement. The proposed measurement method can be applied to low cell gap as well as high cell gap.