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15.2: Invited Paper: LCos Testing Challenges: Defect Measurements in Display and Test Systems
Author(s) -
Smith Peter A.,
Yang Q. Jason
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830427
Subject(s) - liquid crystal on silicon , liquid crystal display , key (lock) , information display , test (biology) , computer science , materials science , computer graphics (images) , optics , optoelectronics , physics , computer security , paleontology , biology
The key electro‐optic liquid crystal on silicon (LCoS) device effects that determine defect contrast in test systems and display systems are highlighted. Special attention is given to optical axis effects and gray shade effects in both test and display systems.