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P‐16: Simulation and Analysis of Overall Raster Moire Patterns on Color CRTs
Author(s) -
Inoue T.,
Motousu H.,
Mikoshiba S.,
Tobe A.,
Oku K.,
Shirai S.
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830245
Subject(s) - moiré pattern , crts , raster graphics , raster scan , curvature , computer science , computer graphics (images) , optics , artificial intelligence , computer vision , mathematics , geometry , physics
Abstract Generation mechanisms of various moire patterns are clarified, and a simulation technique of overall raster moire patterns appearing on the color CRT screen is developed. The moire patterns are found to be sensitive to the slope and curvature of the scan lines. The technique allows to determine various CRT design parameters.