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11.3: Sensitivity of Display Reflection Measurements to Apparatus Geometry
Author(s) -
Kelley Edward F.
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830211
Subject(s) - reflection (computer programming) , sensitivity (control systems) , optics , geometry , light reflection , diffusion , materials science , computer science , physics , mathematics , engineering , electronic engineering , thermodynamics , programming language
Reflection measurements made upon electronic displays can suffer from non‐reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non‐Lambertian diffusion properties. We show the inadequacies of several conventional reflection measurement methods and offer some guidance on how these methods might be improved or replaced.