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54.3: Reliability Estimation and Life Degradation Mechanisms of an Oxide Cathode
Author(s) -
Weon B. M.,
Lee J. S.,
Park G. S.,
Lee G. S.,
Kim W. H.,
Joo M. H.,
Kim H. H.,
Kwon H. J.,
Kim T. H.,
Lee J. S.
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830209
Subject(s) - cathode , degradation (telecommunications) , reliability (semiconductor) , oxide , materials science , brightness , evaporation , cutoff , reliability engineering , analytical chemistry (journal) , computer science , optoelectronics , chemistry , electronic engineering , electrical engineering , engineering , optics , metallurgy , physics , chromatography , thermodynamics , power (physics) , quantum mechanics
Reliability estimation and life degradation mechanisms of an oxide cathode are studied with respect to emission current change. It is significantly affected by cutoff voltage change, barium evaporation, and surface damage. Based on this investigation, we discuss the way to develop an advanced oxide cathode for high brightness application.