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11.2: Standards and Metrology for Reflective LCDs
Author(s) -
Becker Michael E.
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830202
Subject(s) - metrology , robustness (evolution) , computer science , flexibility (engineering) , dimensional metrology , reproducibility , systems engineering , optics , engineering , mathematics , physics , biochemistry , chemistry , statistics , gene
This paper summarizes existing international standards and describes the problems that are currently obstacles in the way to reproducible metrology for reflective LCDs. Identification and removal of these problems shall help establishing a well founded and reasonably applicable international standard for reflective LCD‐metrology. We present a simple concept for detailed characterization of the illumination conditions and introduce a compact new device that supports the required measurements with the due flexibility in illumination geometry, required robustness and reproducibility.