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44.4: Non‐destructive Measuring Device for Stress Profiles in CRT Panels
Author(s) -
Pralle Jens
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830166
Subject(s) - stress (linguistics) , materials science , repeatability , metre , radius , optics , acoustics , structural engineering , computer science , engineering , physics , mathematics , philosophy , linguistics , statistics , astronomy , computer security
Schott has developed a stress‐measuring device based on the scattered light method. Automation of light analysis and software‐based calculation of stress values gives an accurate profile of the through wall stress in a CRT panel. The method is non‐destructive, only a nearly flat (spheres larger than 1 meter radius) surface is a prerequisite. In this paper, we describe the performance and restrictions of this stress‐measuring device for CRT panel glass. We show the advantages in comparison to other methods related to sampling time, measuring cycle time, repeatability of results. Possible applications in the glass‐ and tube‐makers process are discussed. Typical results are shown.