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35.2: Development and Characteristics of a 25‐in. XGA PDP Using LTCC‐M Technology
Author(s) -
Mun J. D.,
Kim I. T.,
Cho C. R.,
Hwang K. T.,
Moon S. J.,
Boo K. H.,
Moon G. J.,
Lee S. H.,
Kwon Y. H.,
Kim M. S.,
Koo B. J.,
Han J. K.,
Kong S. S.,
Kim J. D.
Publication year - 2002
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1830127
Subject(s) - materials science , compatibility (geochemistry) , ceramic , electrical engineering , plasma display , composite material , optoelectronics , electronic engineering , engineering , electrode , physics , quantum mechanics
25″ XGA (165 μm pitch) PDP panel was developed using LTCC‐M (Low Temperature Cofired Ceramic on Metal) technology. Simulations of optimum barrier height and gas composition for maximum power efficiency was carried out and the gas composition was determined to be 71 % He‐25 % Ne‐4 % Xe (in vol %) for the LTCC‐M PDP panel. Some packaging issues including vacuum compatibility of LTCC‐M panel are addressed and the LTCC‐M panel properties are described.