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LCoS microdisplay throughput measurements
Author(s) -
Aastuen David J. W.,
Bruzzone Charles L.
Publication year - 2001
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.1828792
Subject(s) - testbed , throughput , liquid crystal on silicon , computer science , brightness , measure (data warehouse) , projection (relational algebra) , computer hardware , optics , physics , algorithm , liquid crystal display , telecommunications , computer network , database , wireless , operating system
— We propose a straightforward method to measure the absolute throughput of an LCoS microdisplay. The method requires two measurements. The first measurement is of the lumens delivered from a testbed, which includes the microdisplay under test, with a folded light path. The second measurement is of the lumens delivered by the unfolded testbed with the microdisplay removed. This second measurement is used to normalize the first to obtain a fractional transmission that a designer can use to make a meaningful prediction of the system brightness of a LCoS‐based projection system.
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