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A vision system for on‐line inspection of CRT electron‐gun grid gaps
Author(s) -
Chang Ming,
Lin KaoHui,
Mo ChiNeng
Publication year - 2000
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.1828699
Subject(s) - computer science , electron gun , line (geometry) , computer vision , grid , artificial intelligence , path (computing) , image processing , optics , image (mathematics) , physics , electron , cathode ray , geometry , mathematics , quantum mechanics , programming language
— A high‐resolution vision system for on‐line measurements of color CRT electron‐gun (E‐gun) grid gaps has been developed. The measurement principle is based on a digital image‐processing technique combined with a multi‐path imaging system. By utilizing the arrangement of multi‐path image processing, the measurements for different types of guns and for different gaps on a gun can be effectively executed with higher resolution. The purposes of on‐line inspection and statistical quality control are also easily implemented. Experiments were executed in the production line of a 15‐in. monitor, and the experimental results show that the system resolution is about 8.5–10 μm and the on‐line inspection index is about 300 pcs/hour.
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