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The oxide cathode revisited
Author(s) -
Engelsen Daniel
Publication year - 2003
Publication title -
journal of the society for information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.578
H-Index - 52
eISSN - 1938-3657
pISSN - 1071-0922
DOI - 10.1889/1.1825677
Subject(s) - cathode , oxide , materials science , doping , slump , layer (electronics) , degradation (telecommunications) , current (fluid) , decomposition , optoelectronics , composite material , engineering physics , forensic engineering , computer science , electrical engineering , chemistry , metallurgy , physics , telecommunications , engineering , organic chemistry , cement
— A new theory is presented on the emission degradation or slump of oxide cathodes at current drawing and on the beneficial effect of doping the emitting layer with rare‐earth oxides. It was shown that during its lifetime, a gradual voltage difference is built up in the oxide layer, which eventually leads to the decomposition of BaO and O 2 during current drawing. This causes an emission slump in life‐tested cathodes. Doping with rare‐earth oxides prevents this build up due to the electron donating capability of these materials.