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13.1: Measurement and Evaluation of Display Scattering
Author(s) -
Becker Michael E.
Publication year - 2004
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1889/1.1821383
Subject(s) - bidirectional reflectance distribution function , computer science , luminance , sample (material) , detector , transformation (genetics) , scattering , optics , resolution (logic) , simple (philosophy) , computer vision , artificial intelligence , computer graphics (images) , algorithm , reflectivity , physics , telecommunications , biochemistry , chemistry , philosophy , epistemology , gene , thermodynamics
A simple method is introduced for measurement and evaluation of light scattering of electronic displays. The method is based on the measurement of the lateral distribution of reflected luminance with an imaging detector and, after suitable transformation, it yields the characteristics of the BRDF of the sample with high resolution. The method is easy to implement and to carry out, since no directional scanning and painstaking alignments are required. This paper summarizes the basics of the approach, introduces an implementation and presents some typical results.