Open AccessBeam profile measurement of ES-200 using secondary electron emission monitor
Author(s) -
Ehsan Ebrahimi Basabi,
Amir Hossein Feghhi,
M Nikhbakht,
Mehdi Shafiee
Publication year - 2015
Publication title -
iranian journal of physics research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.143
H-Index - 5
eISSN - 2345-3664
pISSN - 1682-6957
DOI - 10.18869/acadpub.ijpr.15.2.253
Subject(s) - beam (structure) , multiplexer , cathode ray , secondary emission , electrical engineering , voltage , microcontroller , materials science , optics , physics , electron , engineering , nuclear physics , multiplexing
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