Open AccessA study on the Visual Information and Reliability in the Certificate of Mark
Author(s) -
Jung Yu Kyung
Publication year - 2016
Publication title -
beu'laendeu di'jainhag yeon'gu
Language(s) - English
Resource type - Journals
eISSN - 1975-0900
pISSN - 1738-0863
DOI - 10.18852/bdak.2016.14.4.105
Subject(s) - certificate , reliability (semiconductor) , computer science , psychology , reliability engineering , engineering , power (physics) , physics , algorithm , quantum mechanics