Open AccessStatus Quo of PVT Characterization
Author(s) -
K. Kramer,
N. Amrizal,
J. B. Beyssac,
L. Brottier,
A. Gagliano,
Stanley Fischer,
M. Herrando,
D. Jonas,
C. de Keizer,
M. Lämmle,
Marta Pellegrini,
Nikola Pokorný,
M. Proell,
Christopher W. Schmidt,
G. Tina,
X. Zhang
Publication year - 2020
Language(s) - English
Resource type - Reports
DOI - 10.18777/ieashc-task60-2020-0004
Subject(s) - status quo , reliability (semiconductor) , characterization (materials science) , test (biology) , durability , engineering , reliability engineering , computer science , political science , database , materials science , nanotechnology , physics , power (physics) , quantum mechanics , law , paleontology , biology
Report B1: This report therefore aims at displaying the Status Quo of PVT Characterization in order to support PVT technology in its further development and applications. The report is hence of interest for researchers as well as public and private sector stakeholders. A key finding is that the reliability and durability of PVT modules are especially challenged at elevated temperatures and higher humidity loads. The test methods available from the IEC and ISO standards are covering the specifics of PV and ST module’s, most of which are similar for PVT modules, too.