Open AccessSTRUCTURAL-PHASE TRANSFORMATIONS IN FILMS AT THE INTERFACE OF THE HETEROSYSTEM “GLASS - CLUSTERS Ag-Pd” – Sn-Pb
Author(s) -
Ya. I. Lepikh,
Tatyana Lavrenova,
A. P. Balaban
Publication year - 2021
Publication title -
sensorna elektronìka ì mìkrosistemnì tehnologìï
Language(s) - English
Resource type - Journals
eISSN - 2415-3508
pISSN - 1815-7459
DOI - 10.18524/1815-7459.2021.2.235202
Subject(s) - microelectronics , phase (matter) , materials science , dispersion (optics) , interface (matter) , reliability (semiconductor) , degradation (telecommunications) , component (thermodynamics) , composite material , optoelectronics , electronic engineering , chemistry , optics , thermodynamics , engineering , physics , power (physics) , organic chemistry , capillary number , capillary action
Structural-phase transformations in films at the interface of the heterosystem "glass - Ag-Pd clusters" – Sn-Pb have been investigated. The relationship between these transformations and the initial system material component dispersion is established at the same film element temperature operating mode. It is shown that structural-phase transformations in contact elements of hybrid integrated circuits microelectronic devices, sensors and solar cells, etc. made of functional materials based on the specified heterosystem can lead to degradation processes and, as a consequence, to a decrease in the electronic product reliability.