Open AccessCdS-Cu2 S HETEROJUNCTION BARRIER PROPERTIES CHARACTERIZATION BY BELIV
Author(s) -
В. А. Борщак
Publication year - 2013
Publication title -
sensorna elektronìka ì mìkrosistemnì tehnologìï
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2415-3508
pISSN - 1815-7459
DOI - 10.18524/1815-7459.2013.3.110464
Subject(s) - heterojunction , materials science , barrier layer , optoelectronics , crystallite , deposition (geology) , rectangular potential barrier , characterization (materials science) , fabrication , charge carrier density , electron mobility , layer (electronics) , nanotechnology , doping , medicine , paleontology , alternative medicine , pathology , sediment , metallurgy , biology