Open AccessENSURING OF RELIABILITY OF METROLOGICAL CHARACTERISTICS OF THE CONDUCTOMETRIC SYSTEMS WITH DIFFERETIAL SENSORS
Author(s) -
В. Г. Мельник,
С. В. Дзядевич,
А. І. Новік,
В. Д. Погребняк,
О. В. Сліцький,
Я. І. Лепіх,
С.В. Лєнков,
Vladyslav Protsenko
Publication year - 2011
Publication title -
sensor electronics and microsystem technologies
Language(s) - English
Resource type - Journals
eISSN - 2415-3508
pISSN - 1815-7459
DOI - 10.18524/1815-7459.2011.4.119304
Subject(s) - conductometry , transducer , reliability (semiconductor) , metrology , computer science , electronic engineering , reliability engineering , biological system , engineering , electrical engineering , chemistry , mathematics , power (physics) , chromatography , physics , statistics , thermodynamics , biology
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