Open AccessTHE INFLUENCE OF LOW TEMPERATURE ANNEALING ON THE CURRENTS IN MCT PHOTODIODES
Author(s) -
Ф. Ф. Сизов,
І. О. Лисюк,
Ж. В. Гуменюк-Сичевська,
З. Ф. Цибрій,
К. В. Андрєєва
Publication year - 2011
Publication title -
sensor electronics and microsystem technologies
Language(s) - English
Resource type - Journals
eISSN - 2415-3508
pISSN - 1815-7459
DOI - 10.18524/1815-7459.2011.1.115952
Subject(s) - photodiode , annealing (glass) , dark current , optoelectronics , materials science , voltage , recombination , analytical chemistry (journal) , chemistry , photodetector , electrical engineering , engineering , composite material , biochemistry , chromatography , gene
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