MEASURES INCREASE RELIABILITY OF ELECTROLUMINESCENT INDICATORS
Author(s) -
С. В. Ленков,
J. A. Gunchenko,
V. V. Zherevchuk,
Ya. I. Lepikh
Publication year - 2008
Publication title -
sensor electronics and microsystem technologies
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2415-3508
pISSN - 1815-7459
DOI - 10.18524/1815-7459.2008.2.114416
Subject(s) - reliability (semiconductor) , electroluminescence , limiting , reliability engineering , principal (computer security) , service (business) , computer science , environmental science , engineering , materials science , business , computer security , physics , nanotechnology , power (physics) , layer (electronics) , mechanical engineering , quantum mechanics , marketing
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