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THE PHISICAL MODEL OF RADIATION-STIMULATED ORDERING DEFFECT STRUCTURE PROCESS IN SEMICONDUCTOR CRYSTALS
Author(s) -
B. Pavlyk,
B. Tsybulyak,
M. V. Lyshak
Publication year - 2007
Publication title -
sensor electronics and microsystem technologies
Language(s) - English
Resource type - Journals
eISSN - 2415-3508
pISSN - 1815-7459
DOI - 10.18524/1815-7459.2007.4.114149
Subject(s) - irradiation , radiation , materials science , ionizing radiation , semiconductor , intensity (physics) , range (aeronautics) , radiant intensity , optoelectronics , optics , physics , composite material , nuclear physics

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