z-logo
open-access-imgOpen Access
Reviewing The Structural Relationship Among the Technology Leadership, Technostress and Technology Acceptance of School Administrators
Author(s) -
Ömer Yahşi,
Sinan Hopcan
Publication year - 2021
Publication title -
anemon muş alparslan üniversitesi sosyal bilimler dergisi
Language(s) - English
Resource type - Journals
eISSN - 2149-4622
pISSN - 2147-7655
DOI - 10.18506/anemon.960670
Subject(s) - technostress , psychology , technology acceptance model , scale (ratio) , information technology , medical education , likert scale , permission , public relations , political science , computer science , medicine , physics , usability , human–computer interaction , quantum mechanics , psychiatry , law , developmental psychology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom