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Reviewing The Structural Relationship Among the Technology Leadership, Technostress and Technology Acceptance of School Administrators
Author(s) -
Ömer Yahşi,
Sinan Hopcan
Publication year - 2021
Publication title -
anemon muş alparslan üniversitesi sosyal bilimler dergisi/anemon muş alparslan üniversitesi sosyal bilimler dergisi.
Language(s) - English
Resource type - Journals
eISSN - 2149-4622
pISSN - 2147-7655
DOI - 10.18506/anemon.960670
Subject(s) - technostress , psychology , technology acceptance model , scale (ratio) , information technology , medical education , likert scale , permission , public relations , political science , computer science , medicine , physics , usability , human–computer interaction , quantum mechanics , psychiatry , law , developmental psychology

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