Open AccessDefinition and evaluation of forecast quality models for the integrated circuits with the use of theory of pattern recognition
Author(s) -
Katerina S. Erantseva,
Et al. Praveenkumar K S,
Михаил Николаевич Пиганов,
Пиганов М. Н,
Roman O. Mishanov,
Мишанов Р. О,
Alina Alekseevna Denisyuk,
Денисюк А.А.
Publication year - 2020
Publication title -
fizika volnovyh processov i radiotehničeskie sistemy
Language(s) - English
Resource type - Journals
eISSN - 2782-294X
pISSN - 1810-3189
DOI - 10.18469/1810-3189.2020.23.2.76-80
Subject(s) - linear discriminant analysis , discriminant , regression analysis , artificial intelligence , econometrics , mathematics , quality (philosophy) , series (stratigraphy) , machine learning , regression , computer science , statistics , pattern recognition (psychology) , paleontology , philosophy , epistemology , biology